MOHSIN, M. A.; NOAMAN, S. A. A TF-IDF and logistic regression baseline for binary sentiment classification of short texts. Future Technology , [S. l.], v. 5, n. 4, p. 157–168, 2026. Disponível em: https://fupubco.com/futech/article/view/1147. Acesso em: 1 sep. 2026.