WEE, S. C. M. X. .; LEE, H. E. .; CHUA, H. S. . Classification of vanilla by quality using MOS gas sensors: assessing the effectiveness of wavelet time-frequency analyzer. Future Technology , [S. l.], v. 3, n. 4, p. 12–21, 2024. Disponível em: https://fupubco.com/futech/article/view/184. Acesso em: 4 dec. 2024.