Wee, Sherlyn Cheryl May Xin, Hui En Lee, and Hong Siang Chua. “Classification of Vanilla by Quality Using MOS Gas Sensors: Assessing the Effectiveness of Wavelet Time-Frequency Analyzer”. Future Technology 3, no. 4 (July 4, 2024): 12–21. Accessed December 4, 2024. https://fupubco.com/futech/article/view/184.